IEEE ISQED 2000 FINAL PROGRAM
SUMMARY
The conference will be held on Monday March
20, through Wednesday March 22, in DoubleTree Hotel in San Jose, CA, USA. A full day tutorials will be held on Monday, March 20. There will be a total
of 15 tutorial sessions, delivered by 25 leading experts. The conference starts on Monday evening with reception and panel discussions.
This would be the 1st of five panel discussions held throughout the ISQED 2000. More than 30 experts are participating in these panels. The conference
includes two plenary sessions, held on Tuesday and Wednesday mornings respectively.
Plenary sessions feature seven keynote speeches by industry and academia leaders. There will be 12 other technical sessions, composed of 65 papers on
Tuesday and Wednesday. ISQED features two luncheons and two evening
receptions. Best paper awards will be presented during Tuesday luncheon.
CONFERENCE OVERVIEW
Date | Time | Room 1 | Room 2 | Room 3 |
Mon. 3/20/00
|
8:30am- 5:00pm | Tutorial Track I Design for Reliability & Manufacturability |
Tutorial Track II Design for Quality |
Tutorial Track III Closing the Manufacturing Loop |
6:30pm-8:30pm |
Evening Reception &
Panel Discussion |
|||
Tue. 3/21/00 |
9:00am-12:00pm |
PLENARY SESSION I |
||
12:00pm-1:25pm |
LUNCHEON |
|||
1:25pm-3:10pm | SESSION 1A:
Panel Discussion 2 What is design quality? Can quality in electronic design be quantified, and how? |
SESSION 1B DSM Modeling |
SESSION 1C
Emerging Process and Device Technology |
|
3:10pm-3:25pm |
BREAK |
|||
3:25pm-5:35pm | SESSION 2A
Quality of Design and EDA Tools |
SESSION 2B
Emerging Integrity Issues |
SESSION 2C
Low Power Test |
|
6:30pm-8:30pm |
Evening Reception &
Panel Discussion |
|||
Wed. 3/22/00 |
8:45am-10:15am |
PLENARY SESSION II |
||
10:15am-10:40am |
BREAK |
|||
10:40am-12:00pm | SESSION 3A
Quality in IP Blocks |
SESSION 3B Quality Issues with Emerging Processes |
SESSION 3C
Poster papers |
|
12:00pm-1:25pm |
LUNCHEON |
|||
1:25pm-3:10pm | SESSION 4A:
Panel Discussion 4 Focus on quality of design: Does it help or hinder time to market? |
SESSION 4B Quality Definition and Metrics |
SESSION 4C
Low Power Design & Test |
|
3:10pm-3:25pm |
BREAK |
|||
3:25pm-5:35pm | SESSION 5A:
Panel Discussion 5 Design-manufacturing interface in deep sub micron era: Is technology independent design dead? |
SESSION 5B
Design for Manufacturability |
SESSION 5C
Capacitive/Inductive Coupling Issues |
To view the final program in PDF format, click
here
Home| | Conference| | Committee| | Sponsors| | Resources| | Registration| | News |
International Symposium
on Quality of Electronic Design |