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Session 2A

Tuesday 3/21/00

3:25pm - 5:35pm

Quality of Design and EDA Tools

 

Co-Chairs: George Alexiou, University Of Patras, Patras, Greece, Kevin Lashkari, Ultratech Steppers

 

3:25pm

Introduction

3:30pm

2A.1 Quality-Driven System on Chip Design (Invited)

Lech Józwiak Eindhoven University of Technology, Eindhoven, The Netherlands

3:55pm

2A.2 Advancing Customer-Perceived quality in the EDA

Industry (Invited)

Ben-Yaacov, Larry Bjork, and Ed Stone, Synopsys, Mountain View, CA

4:20pm

2A.3 Quality Memory Blocks - Balancing The Trade-offs (Invited)

Betty Prince, Memory Strategies International, Leander, Texas, USA

4:45pm

2A.4 Should Yield be a Design Objective? (Invited)

Israel Koren, University of Massachusetts, Amherst, MA

5:10pm

2A.5 Early Addressing IC and Packaging Relationship Allows an Overall Better Quality of Complex SoC

Anna Fontanelli, Roberto Branco and Giorgio Mastrorocco

STMicroelectronics, Agrate Brianza, Italy


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International Symposium on Quality of Electronic Design
Copyright © 1998 ISQED. All rights reserved.
Revised: May 13, 2001 .