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Session 2A

Tuesday 3/21/00

3:25pm - 5:35pm

Quality of Design and EDA Tools


Co-Chairs: George Alexiou, University Of Patras, Patras, Greece, Kevin Lashkari, Ultratech Steppers





2A.1 Quality-Driven System on Chip Design (Invited)

Lech Józwiak Eindhoven University of Technology, Eindhoven, The Netherlands


2A.2 Advancing Customer-Perceived quality in the EDA

Industry (Invited)

Ben-Yaacov, Larry Bjork, and Ed Stone, Synopsys, Mountain View, CA


2A.3 Quality Memory Blocks - Balancing The Trade-offs (Invited)

Betty Prince, Memory Strategies International, Leander, Texas, USA


2A.4 Should Yield be a Design Objective? (Invited)

Israel Koren, University of Massachusetts, Amherst, MA


2A.5 Early Addressing IC and Packaging Relationship Allows an Overall Better Quality of Complex SoC

Anna Fontanelli, Roberto Branco and Giorgio Mastrorocco

STMicroelectronics, Agrate Brianza, Italy

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International Symposium on Quality of Electronic Design
Copyright © 1998 ISQED. All rights reserved.
Revised: May 13, 2001 .