In this article we present several approaches to improving pin accessibility of standard cells designed with ASAP7 PDK. These approaches are refining pin layout, using double-row height cells, using double-row height cells with must-join pins, inserting dummy polys into hard-to-access cells, and excluding cells with poor pin accessibility from a cell library. We create five 6-track standard cell libraries using these approaches. We also look into pin-access challenges intrinsically tied to a process technology. Experimental results show that the approaches of inserting dummy polys into hard-to-access cells and refining pin layout persistently are most effective in mitigating pin access problems.