To manage yield on ever-growing memories in SoCs it is critical not to compromise on the yield and reliability of the fuse box storing the memory repair data. Thus, the latest eFuse memories support Error-Correcting Code (ECC) and repair functions to increase reliability and enhance yield. However, conventional DFT methods do not provide solutions to leverage those features. This paper presents a custom designed ECC logic module that allows an eFuse box to seamlessly interface with its BISR controller. Moreover, a methodology to enable eFuse repair with existing DFT resources is proposed.