A Compact Model of Negative Bias Temperature Instability Suitable for Gate-Level Circuit Simulation

Xu Liu1, Alessandro Bernardini2, Ulf Schlichtmann2, Xing Zhou1
1Nanyang Technological University, 2Technical University of Munich


Previously, the AC-case negative bias temperature instability has been modelled with iterative method to account for its recovery effect. A significant disadvantage of the iterative method is its low time-efficiency. A new algorithm is proposed, which requires a one-time simulation; besides, it gives identical result as the iterative method. The time-efficiency could thus be improved by orders.