Characterization of Fast, Accurate Leakage Power Models for IEEE P2416

Barkha Gupta and W. Rhett Davis
North Carolina State University


Recent results in power modeling for the emerging IEEE Standard Association project P2416 are presented. The standard promises to bring accurate power-modeling capability to system-level digital design tools. This paper presents the leakage power-model characterization approach in detail in the context of a simple four-gate circuit. Simulation results with a commercial 45nm technology over a range of temperatures and supply voltages show agreement with SPICE to within 1.8% on average and 16.6% in the worst case with a speedup of over 15,000X.