In this paper at first we present a new test vector multi-bit correction technique for capture power reduction (average and peak) in scan based launch-on-capture transition delay testing of IP cores. Then we present a method which combines the test vector multi-bit correction technique and the dictionary based test data compression method of [10] in order to derive compressed test data with low capture power. Main characteristic of this technique is that the reduction of the capture power is obtained without (or with marginal) degradation of the compression efficiency. The efficiency of the proposed method is verified with simulations.