There is a strong demand for both calibrating and testing the ADC performance before and after packaging for mixed-signal SoCs and SiPs. In this paper, we propose a built-in self-calibration scheme which offers digitally-controlled calibration of a pipelined ADC without using external stimulus. We further propose a self-testing strategy which uses the effective number of bits (ENOB) directly derived from the steady-state error of the self-calibration process for go/no-go testing as well as for performance binning. This test process will not incur any additional test time beyond the time required for calibration.