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As technology scales, relative transistor and interconnect variability increases. Left unchecked, variability could become a serious challenge to design performance. Careful analysis and characterization, together with variability management techniques, can reduce pessimism and enable higher quality design. This panel explores methods available to characterize and mitigate the effects of variability, from manufacturing process control, through physical IP design, to place and route. |
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Panelists: Walter Ng, Senior Director, Platform Alliances, Chartered Rob Aitken, ARM Fellow Stefano Zanella, Software Development Manager, PDF Solutions Ayhan Mutlu - Technical Staff Member, Extreme-DA
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