Session 2C

San Martin Room

1:00pm - 3:05pm

Performance and Reliability Analysis for Yield Optimization

Chairs:    Amir Ajami, Magma Design Automation

Adrian Ionescu, Swiss Federal Institute of Technology (EPFL)

1:00pm

Introduction

1:05pm

2C.1       

Parametric Yield Analysis and Constrained-Based Supply Voltage Optimization

Rahul Rao, Kanak Agarwal, Anirudh Devgan, Dennis Sylvester, Richard Brown, Kevin Nowka, University of Michigan

1:35pm

2C.2       

Power-Delay Metrics Revisited for 90nm CMOS Technology

Dipanjan Sengupta, Resve Saleh, University of British Columbia, Canada

2.05pm

2C.3       

Optimization of Individual Well Adaptive Body Biasing (IWABB) Using a Multiple Objective Evolutionary Algorithm

Justin Gregg, and Tom W. Chen, Colorado State University

2.35pm

2C.4       

Electromigration Reliability Comparison of Cu and Al Interconnects

Syed M. Alam*, Frank L. Wei, Chee L. Gan**, Carl V. Thompson, Donald E. Troxel, *Freescale Semiconductor, **Nanyang Technological

University, Massachusetts Institute of Technology